Surface Analysis
Major surface analysis equipment available within the Department includes two ultra-high vacuum (UHV) surface analysis instruments with facilities for low energy electron diffraction (LEED), thermal desorption spectrometry, Auger electron spectroscopy, X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM). The Department also houses a scanning probe laboratory, operated by Professor John Stickney. The facility houses three Nanoscope III control units, used to run STM studies in air, in solution (in-situ under electrochemical control), and in UHV. These control units are also used to run two atomic force microscopes (AFM). Facilities are available for running both STM and AFM in inert gas environments.
